Testex Tape for Measuring Surface Profile

The Testex tape process of measuring surface profile has been used for over 50 years.  It is a simple, reliable, and repeatable way of determining surface profile parameters.  DeFelsko acquired the Testex tape line and incorporated it into their range of instruments, for increased compatibility and greater convenience for inspectors.

Tape options include the following:

• Conventional Testex Press-O-Film Tape grades.
  • Use with analog spring micrometers or with the PosiTector RTR H probe.
  • Available in 4 versions:
    • Coarse Minus.  (for 0.5 – 1.0 mils / 12 – 25 µm)
    • Coarse.  (for 0.8 – 2.5 mils / 20 – 64 µm)
    • X-Coarse. (for 1.5 – 4.5 mils / 38 – 115 µm)
    • X-Coarse Plus (for 4.6 – 5.0 mils / 116 – 127 µm)
• Optical Grade Testex Press-O-Film Tape Grades
  • Use with PosiTector RTR 3D probe.  Provides higher quality surface data files (.sdf) than conventional replica tape.  Available in 2 versions.
    • Coarse (for 0.8 -2.5 mils / 20 – 64µm)
    • X-Coarse (for 1.5 – 4.5 mils / 38 – 115 µm)