Testex Tape for Measuring Surface Profile

SKU: P-INE1122

The Testex tape process of measuring surface profile has been used for over 50 years.  It is a simple, reliable, and repeatable way of determining surface profile parameters.  DeFelsko acquired the Testex tape line and incorporated it into their range of instruments, for increased compatibility and greater convenience for inspectors.

Tape options include the following:

  • Conventional Testex Press-O-Film Tape grades.
    • Use with analog spring micrometers or with the PosiTector RTR H probe.
    • Available in 4 versions:
      • Coarse Minus.  (for 0.5 – 1.0 mils / 12 – 25 µm)
      • Coarse.  (for 0.8 – 2.5 mils / 20 – 64 µm)
      • X-Coarse. (for 1.5 – 4.5 mils / 38 – 115 µm)
      • X-Coarse Plus (for 4.6 – 5.0 mils / 116 – 127 µm)
  • Optical Grade Testex Press-O-Film Tape Grades
    • Use with PosiTector RTR 3D probe.  Provides higher quality surface data files (.sdf) than conventional replica tape.  Available in 2 versions.
      • Coarse (for 0.8 -2.5 mils / 20 – 64µm)
      • X-Coarse (for 1.5 – 4.5 mils / 38 – 115 µm)

Testex Tape for Measuring Surface Profile

SKU: P-INE1122

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$38.00 - $50.00

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$38.00$50.00

Description

Testex Press-O-Film replica tape is available in a variety of thickness ranges for measuring substrate roughness.  The primary range for measurement with replica tape is 20 to 115 µm (0.8 to 4.5 mils).  Use of Coarse Minus grade (<20µm or 0.8 mil) or X-Coarse Plus grade tape >115µm or >4.5 mils) should primarily be restricted to checking measurements at the lower and upper ends of the primary range.

Testex Press-O-FIlm Optical Grade replica tape, when used with the PosiTector RTR 3D model, provides higher quality surface data files (.sdf) than conventional replica tape.  Optical Grade Replica Tape is available in Coarse or X-Coarse.